A study on effects of total ionizing dose on hot carrier...

Results in Physics 2019 / 06 Vol. 13

A study on effects of total ionizing dose on hot carrier effect of PD I/O SOI PMOSFETs

Zhao, Jinghao, Zheng, Qiwen, Cui, Jiangwei, Zhou, Hang, Liang, Xiaowen, Yu, Xuefeng, Guo, Qi
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Volume:
13
Language:
english
Journal:
Results in Physics
DOI:
10.1016/j.rinp.2019.102223
Date:
June, 2019
File:
PDF, 695 KB
english, 2019
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