Ion Beam Induced Artifacts in Lead-Based Chalcogenides

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Microscopy and Microanalysis 2019 / 5

Ion Beam Induced Artifacts in Lead-Based Chalcogenides

Zhang, Xiaomi, Hao, Shiqiang, Tan, Gangjian, Hu, Xiaobing, Roth, Eric W., Kanatzidis, Mercouri G., Wolverton, Chris, Dravid, Vinayak P.
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Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619000503
Date:
May, 2019
File:
PDF, 762 KB
english, 2019
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