Electronic Transport Evidence for Topological Nodal-Line...

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ACS Applied Electronic Materials 2019 / 05

Electronic Transport Evidence for Topological Nodal-Line Semimetals of ZrGeSe single crystals

Guo, Lei, Chen, Ting-Wei, Chen, Chen, Chen, Lei, Zhang, Yang, Gao, Guan-Yin, Yang, Jie, Li, Xiao-Guang, Zhao, Weiyao, Dong, Shuai, Zheng, Ren-Kui
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Language:
english
Journal:
ACS Applied Electronic Materials
DOI:
10.1021/acsaelm.9b00061
Date:
May, 2019
File:
PDF, 4.51 MB
english, 2019
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