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Soft Computing - A Fusion of Foundations, Methodologies and Applications 2019 / 3

A variable-level automated defect identification model based on machine learning

Zhang, Yuwei, Xing, Ying, Gong, Yunzhan, Jin, Dahai, Li, Honghui, Liu, Feng
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Language:
english
Journal:
Soft Computing
DOI:
10.1007/s00500-019-03942-3
Date:
March, 2019
File:
PDF, 1.71 MB
english, 2019
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