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AIP Conference Proceedings [Author(s) Proceedings of the 17th International Conference on Ion Sources - Geneva, Switzerland (15–20 September 2017)] - EBIS-based HCI micro-beams
Schmidt, M., Laux, P.-F., Gierak, J., Zschornack, G.Volume:
2011
Year:
2018
Language:
english
DOI:
10.1063/1.5053408
File:
PDF, 2.85 MB
english, 2018