Analysis of Minority Carrier Lifetime Dependence on Dual Gate Feedback Field Effect Transistor
Park, Kyungchul, Kwon, Min-Woo, Baek, Myung-Hyun, Hwang, Sungmin, Jang, Taejin, Kim, Taehyung, Park, Byung-GookVolume:
19
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2019.17107
Date:
October, 2019
File:
PDF, 601 KB
english, 2019