Comprehensive study of variability in poly-Si channel...

Comprehensive study of variability in poly-Si channel nanowire transistor

Ota, Kensuke, Kawai, Tomoya, Saitoh, Masumi
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Volume:
58
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/1347-4065/aafc9d
Date:
April, 2019
File:
PDF, 948 KB
english, 2019
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