Defects detection on TFT lines of flat panels using a feed forward neural network
Abeysundara, H.A., Hamori, Hiroshi, Matsui, Takeshi, Sakawa, MasatoshiVolume:
2
Journal:
Artificial Intelligence Research
DOI:
10.5430/air.v2n4p1
Date:
May, 2013
File:
PDF, 730 KB
2013