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The Effect of Ion-Beam Bombardment on Solution-Processed Nickel Oxide Films Used for Liquid Crystal Alignment
Jeong, Hae-Chang, Won, Jonghoon, Lee, Ju Hwan, Kim, Dong Hyun, Lee, Dong Wook, Lee, Yun-Gun, Oh, Byeong Yun, Han, Jeong min, Seo, Dae-ShikVolume:
8
Year:
2019
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.0081904jss
File:
PDF, 1.00 MB
english, 2019