[IEEE 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Sapporo, Japan (2019.5.26-2019.5.29)] 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Statistical Modeling of Read Static Noise Margin for 6-Transistor SRAM cell
Bang, Byeong-Jun, Kwon, Hyunjeong, Kim, Young Hwan, Cho, Kyoungrok, Kim, Hi-SeokYear:
2019
DOI:
10.1109/ISCAS.2019.8702663
File:
PDF, 527 KB
2019