Assessment of interfacial layer thickness of pulsed laser deposited plasmonic copper thin films via spectroscopic ellipsometer
Kesarwani, Rahul, Khare, AlikaVolume:
93
Language:
english
Journal:
Optical Materials
DOI:
10.1016/j.optmat.2019.05.009
Date:
July, 2019
File:
PDF, 1.09 MB
english, 2019