Assessment of interfacial layer thickness of pulsed laser...

Assessment of interfacial layer thickness of pulsed laser deposited plasmonic copper thin films via spectroscopic ellipsometer

Kesarwani, Rahul, Khare, Alika
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Volume:
93
Language:
english
Journal:
Optical Materials
DOI:
10.1016/j.optmat.2019.05.009
Date:
July, 2019
File:
PDF, 1.09 MB
english, 2019
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