![](/img/cover-not-exists.png)
Relating microstructure to defect behavior in AA6061 using a combined computational and multiscale electron microscopy approach
Yoo, Yung Suk Jeremy, Lim, Hojun, Emery, John, Kacher, JoshLanguage:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2019.05.033
Date:
May, 2019
File:
PDF, 6.78 MB
english, 2019