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[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect
Lei, Jun-Yang, Moon, Thomas, Chow, Justin, Sitaraman, Suresh K., Chatterjee, AbhijitYear:
2018
DOI:
10.1109/ATS.2018.00044
File:
PDF, 1.35 MB
2018