Adaptive Scan for Atomic Force Microscopy Based on Online...

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Adaptive Scan for Atomic Force Microscopy Based on Online Optimization: Theory and Experiment

Wang, Kaixiang, Ruppert, Michael G., Manzie, Chris, Nesic, Dragan, Yong, Yuen Kuan
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Control Systems Technology
DOI:
10.1109/TCST.2019.2895798
File:
PDF, 59 KB
english, 2019
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