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Reliability concern of quasi-vertical GaN Schottky barrier diode under high temperature reverse bias stress
Li, Sheng, Zhang, Chi, Liu, Siyang, Wei, Jiaxing, Zhang, Long, Sun, Weifeng, Zhu, Youhua, Zhang, Tingting, Wang, Dongsheng, Sun, YinxiaVolume:
130
Language:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2019.04.041
Date:
June, 2019
File:
PDF, 2.33 MB
english, 2019