Probing proximity effects in the ferromagnetic semiconductor EuO
Averyanov, Dmitry V., Tokmachev, Andrey M., Parfenov, Oleg E., Karateev, Igor A., Sokolov, Ivan S., Taldenkov, Alexander N., Platunov, Mikhail S., Wilhelm, Fabrice, Rogalev, Andrei, Storchak, VyacheslLanguage:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2019.05.191
Date:
May, 2019
File:
PDF, 1.34 MB
english, 2019