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[IEEE 2018 International Conference on Intelligent Systems (IS) - Funchal - Madeira, Portugal (2018.9.25-2018.9.27)] 2018 International Conference on Intelligent Systems (IS) - A Robust and Fast Deep Learning-Based Method for Defect Classification in Steel Surfaces

Saiz, Fatima A., Serrano, Ismael, Barandiaran, Inigo, Sanchez, Jairo R.
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Year:
2018
DOI:
10.1109/IS.2018.8710501
File:
PDF, 1.01 MB
2018
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