[IEEE 2018 International Conference on Intelligent Systems (IS) - Funchal - Madeira, Portugal (2018.9.25-2018.9.27)] 2018 International Conference on Intelligent Systems (IS) - A Robust and Fast Deep Learning-Based Method for Defect Classification in Steel Surfaces
Saiz, Fatima A., Serrano, Ismael, Barandiaran, Inigo, Sanchez, Jairo R.Year:
2018
DOI:
10.1109/IS.2018.8710501
File:
PDF, 1.01 MB
2018