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High -spatial-resolution X-ray Inspection by Pixelated Scintillator
Miyao, Sho, Tanino, Takahiro, Shigeta, KazukiVolume:
11
Year:
2018
Language:
english
Journal:
Transactions of The Japan Institute of Electronics Packaging
DOI:
10.5104/jiepeng.11.e18-011-1
File:
PDF, 2.40 MB
english, 2018