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Optimal truncated repetitive lot inspection with defect rates
Pérez-González, Carlos J., Fernández, Arturo J., Kohansal, Akram, Asgharzadeh, AkbarLanguage:
english
Journal:
Applied Mathematical Modelling
DOI:
10.1016/j.apm.2019.05.032
Date:
May, 2019
File:
PDF, 768 KB
english, 2019