[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers
Padovani, Andrea, Pesic, Milan, Kumar, Mondol Anik, Blomme, Pieter, Subirats, Alexandre, Vadakupudhupalayam, Senthil, Baten, Zunaid, Larcher, LucaYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720566
File:
PDF, 34 KB
english, 2019