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Comparative Study of Negative Capacitance Field-Effect Transistors with Different MOS Capacitances
Li, Jing, Liu, Yan, Han, Genquan, Zhou, Jiuren, Hao, YueVolume:
14
Language:
english
Journal:
Nanoscale Research Letters
DOI:
10.1186/s11671-019-3013-z
Date:
December, 2019
File:
PDF, 1.57 MB
english, 2019