Relating Microstructure to Defect Behavior in AA6061 Using a Combined Computational and Multiscale Electron Microscopy Approach
Yoo, Yung Suk Jeremy, Lim, Hojun, Emery, John, Kacher, JoshYear:
2019
Language:
english
Journal:
SSRN Electronic Journal
DOI:
10.2139/ssrn.3358892
File:
PDF, 1.37 MB
english, 2019