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Statistical evaluation method for lifetime distribution in field-accelerated time-dependent dielectric breakdown using two-step probability plot and multilink test scheme
Tate, Kazuki, Yokogawa, ShinjiVolume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.07MG02
Date:
July, 2018
File:
PDF, 2.68 MB
english, 2018