Solution–TiO 2 Interface Probed...

Japanese Journal of Applied Physics 2009 / 8 Vol. 48; Iss. 8

Solution–TiO 2 Interface Probed by Frequency-Modulation Atomic Force Microscopy

Hiasa, Takumi, Kimura, Kenjiro, Onishi, Hiroshi, Ohta, Masahiro, Watanabe, Kazuyuki, Kokawa, Ryohei, Oyabu, Noriaki, Kobayashi, Kei, Yamada, Hirofumi
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Volume:
48
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.48.08JB19
Date:
August, 2009
File:
PDF, 274 KB
english, 2009
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