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Reliability analysis for devices subject to competing failure processes based on chance theory
Liu, Baoliang, Zhang, Zhiqiang, Wen, YanqingLanguage:
english
Journal:
Applied Mathematical Modelling
DOI:
10.1016/j.apm.2019.05.036
Date:
May, 2019
File:
PDF, 1.08 MB
english, 2019