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Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system
Dinh, L. N., Stanford, J. A., Saw, C. K., Nelson, A. J., Gollott, R., Haschke, J. M., Allen, P. G., Gardner, C., Hrousis, C., Siekhaus, W. J., McLean, W.Volume:
125
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5092129
Date:
May, 2019
File:
PDF, 2.68 MB
english, 2019