Temperature and Thickness Dependent Electrical Breakdown Modulated by Coupling model of Charge Transport and Molecular Chain Dynamics
Xie, Dongri, Min, Daomin, Yang, Liuqing, Li, ShengtaoLanguage:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/ab257a
Date:
May, 2019
File:
PDF, 1.62 MB
english, 2019