[ACM Press the 56th Annual Design Automation Conference 2019 - Las Vegas, NV, USA (2019.06.02-2019.06.06)] Proceedings of the 56th Annual Design Automation Conference 2019 on - DAC '19 - Process, Circuit and System Co-optimization of Wafer Level Co-Integrated FinFET with Vertical Nanosheet Selector for STT-MRAM Applications

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