Vulnerabilities and Reliability of ReRAM Based PUFs and...

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IEEE Transactions on Reliability 2019

Vulnerabilities and Reliability of ReRAM Based PUFs and Memory Logic

Schultz, Thomas, Jha, Rashmi, Casto, Matt, Dupaix, Brian
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2019.2910793
File:
PDF, 35 KB
english, 2019
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