P‐171: The Mechanism of the OLED Reliability Failure for...

SID Symposium Digest of Technical Papers 2019 / 06 Vol. 50; Iss. 1

P‐171: The Mechanism of the OLED Reliability Failure for Thin Film Encapsulation in Lateral Direction

Wang, Tao, Sun, Tao, Xie, Chunyan, Wang, Youwei, Qin, Chengjie, Zhang, Ziyu, Zhou, Weifeng, Zhang, Song
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Language:
english
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.13328
Date:
June, 2019
File:
PDF, 1.38 MB
english, 2019
Conversion to is in progress
Conversion to is failed