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[IEEE 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Anaheim, CA, USA (2019.3.17-2019.3.21)] 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - First Observations in Degradation Testing of Planar Magnetics
Shen, Zhan, Wang, Qian, Shen, Yanfeng, Wang, HuaiYear:
2019
Language:
english
DOI:
10.1109/APEC.2019.8721770
File:
PDF, 34 KB
english, 2019