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Abstract Test Case Prioritization Using Repeated Small-Strength Level-Combination Coverage
Huang, Rubing, Sun, Weifeng, Chen, Tsong Yueh, Towey, Dave, Chen, Jinfu, Zong, Weiwen, Zhou, YunanYear:
2019
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2019.2908068
File:
PDF, 57 KB
english, 2019