Evaluation of Bulk and SOI FeFET Architecture for Non-Volatile Memory Applications
Mallick, Antik, Shukla, NikhilVolume:
7
Year:
2019
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2019.2906834
File:
PDF, 1.24 MB
english, 2019