ESD Behavior of AlGaN/GaN Schottky Diodes
Shankar, Bhawani, Gupta, Sayak Dutta, Soni, Ankit, Raghavan, Srinivasan, Shrivastava, MayankVolume:
19
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2916846
Date:
June, 2019
File:
PDF, 35 KB
english, 2019