Physical Unclonable Functions for On-Chip Instrumentation:...

IEEE Consumer Electronics Magazine 2019 / 7 Vol. 8; Iss. 4

Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network

K., Sudeendra Kumar, Satheesh, Naini, Mahapatra, Abhishek, Sahoo, Sauvagya, Mahapatra, K.K.
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Volume:
8
Language:
english
Journal:
IEEE Consumer Electronics Magazine
DOI:
10.1109/MCE.2019.2905539
Date:
July, 2019
File:
PDF, 1.54 MB
english, 2019
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