High-frequency dielectric characterization of electronic...

Journal of Applied Physics 2019 / 05 Vol. 125; Iss. 20

High-frequency dielectric characterization of electronic defect states in co-sputtered W-doped TiO 2

Delegan, N., Teranishi, T., El Khakani, M. A.
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Volume:
125
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5087061
Date:
May, 2019
File:
PDF, 2.04 MB
english, 2019
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