[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Aging-Aware Design Verification Methods Under Real Product Operating Conditions
Shim, Hyewon, Jo, Jeongmin, Kim, Yoohwan, Jeong, Bongyong, Shon, Minji, Jiang, Hai, Pae, SangwooYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720466
File:
PDF, 791 KB
english, 2019