[IEEE 2019 IEEE International Reliability Physics Symposium...

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[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor

Wang, Miaomiao, Zhang, Jingyun, Zhou, Huimei, Southwick, Richard G., Kuo Chao, Robin Hsin, Miao, Xin, Basker, Veeraraghavan S., Yamashita, Tenko, Guo, Dechao, Karve, Gauri, Bu, Huiming, Stathis, James
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Year:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720573
File:
PDF, 1.98 MB
english, 2019
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