[IEEE 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID) - Delhi, NCR, India (2019.1.5-2019.1.9)] 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID) - On-chip MISR Compaction Technique to Reduce Diagnostic Effort and Test Time

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