‘Box‐profile’ Ion Implants as Geochemical Reference...

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Geostandards and Geoanalytical Research (Wiley) 2019 / 06

‘Box‐profile’ Ion Implants as Geochemical Reference Materials for EPMA and SIMS

Wu, Haosheng, Böttger, Roman, Couffignal, Frédéric, Gutzmer, Jens, Krause, Joachim, Munnik, Frans, Renno, Axel D., Hübner, René, Wiedenbeck, Michael, Ziegenrücker, René
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Language:
english
Journal:
Geostandards and Geoanalytical Research
DOI:
10.1111/ggr.12282
Date:
June, 2019
File:
PDF, 748 KB
english, 2019
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