Pole figure analysis from electron backscatter...

Applied Physics Express 2019 / 02 Vol. 12; Iss. 2

Pole figure analysis from electron backscatter diffraction—an effective method of evaluating fiber-textured silicon thin films as seed layers for epitaxy

Hainey, Mel, Robin, Yoann, Amano, Hiroshi, Usami, Noritaka
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Volume:
12
Journal:
Applied Physics Express
DOI:
10.7567/1882-0786/aafb26
Date:
February, 2019
File:
PDF, 998 KB
2019
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