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Synthesis, structural, strength and corrosion properties of thin films of the type CuX (X = Bi, Mg, Ni)

Kozlovskiy, A. L., Zdorovets, M. V.
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Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-019-01556-x
Date:
May, 2019
File:
PDF, 4.75 MB
2019
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