Synthesis, structural, strength and corrosion properties of thin films of the type CuX (X = Bi, Mg, Ni)
Kozlovskiy, A. L., Zdorovets, M. V.Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-019-01556-x
Date:
May, 2019
File:
PDF, 4.75 MB
2019