[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - A Smart Fault Detection Scheme for Reliable Image Processing Applications
Biasielli, Matteo, Bolchini, Cristiana, Cassano, Luca, Miele, AntonioYear:
2019
Language:
english
DOI:
10.23919/DATE.2019.8714945
File:
PDF, 559 KB
english, 2019