Research on Threshold Voltage Instability in SiC MOSFET Devices with Precision Measurement
Liu, Ao, Bai, Song, Huang, Run Hua, Yang, Tong Tong, Liu, HaoVolume:
954
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.954.133
Date:
May, 2019
File:
PDF, 1.46 MB
english, 2019