The Influence of Temperature Storage on Threshold Voltage Stability for SiC VDMOSFET
Bai, Zhi Qiang, Tang, Xiao Yan, Han, Chao, He, Yan Jing, Song, Qing Wen, Jia, Yi Fan, Zhang, Yi Men, Zhang, Yu MingVolume:
954
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.954.144
Date:
May, 2019
File:
PDF, 550 KB
english, 2019