How Does a Plasmon-Induced Hot Charge Carrier Break a C–C Bond?
Huh, Hyun, Trinh, Hoa Duc, Lee, Dokyung, Yoon, SangwoonLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.9b05509
Date:
June, 2019
File:
PDF, 872 KB
english, 2019