![](/img/cover-not-exists.png)
Atomic force microscopy with integrated on-chip interferometric readout
Zawierta, Michal, Jeffery, Roger D., Putrino, Gino, Silva, K.K.M.B. Dilusha, Keating, Adrian, Martyniuk, Mariusz, Faraone, LorenzoJournal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.05.011
Date:
May, 2019
File:
PDF, 1.56 MB
2019