Structural characterization of the LaInO 3...

APL Materials 2019 / 03 Vol. 7; Iss. 3

Structural characterization of the LaInO 3 /BaSnO 3 interface via synchrotron scattering

Lau, Claudia, Kim, Youjung, Albright, Stephen, Char, Kookrin, Ahn, C. H., Walker, F. J.
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Volume:
7
Journal:
APL Materials
DOI:
10.1063/1.5084058
Date:
March, 2019
File:
PDF, 2.71 MB
2019
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