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[IEEE 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST) - Xi'an, China (2019.4.22-2019.4.27)] 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST) - You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems
Liu, Kui, Koyuncu, Anil, Bissyande, Tegawende F., Kim, Dongsun, Klein, Jacques, Le Traon, YvesYear:
2019
Language:
english
DOI:
10.1109/ICST.2019.00020
File:
PDF, 50 KB
english, 2019