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Sub-micron scale distributions of trace elements in zircon
Amy E. Hofmann, John W. Valley, E. Bruce Watson, Aaron J. Cavosie, John M. EilerVolume:
158
Language:
english
Pages:
19
DOI:
10.1007/s00410-009-0385-6
Date:
September, 2009
File:
PDF, 816 KB
english, 2009